X2xx/s (X200/s-260) Samsung SSD SMART Werte schlecht?

C

cyrax

Active member
Themenstarter
Registriert
24 Sep. 2010
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273
Hey,

ich habe hier eine Samsung SSD liegen, die in einem X200s verbaut war.
Ich habe zuerst ein "Secure Erease" durchgeführt und anschließend einen Self Test gemacht.
Beides habe ich im Life System "Parted Magic" mit den dazugehörigen Tools ausgeführt.

Ich werde aus dem Log nicht so wirklich schlau, da steht zum einen das der Test "Pased" ist aber es werden trotzdem Fehler ausgegeben die ich aber nicht interpretieren kann.
Kann mir da jemand helfen?

Hier die Log Datei:

Code: 
smartctl 6.3 2014-07-26 r3976 [x86_64-linux-3.17.3-pmagic64] (local build)
Copyright (C) 2002-14, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Device Model:     SAMSUNG MMCQE28G8MUP-0VA
Serial Number:    SE928A5551
Firmware Version: VAM08L1Q
User Capacity:    128.035.676.160 bytes [128 GB]
Sector Size:      512 bytes logical/physical
Rotation Rate:    Solid State Device
Device is:        Not in smartctl database [for details use: -P showall]
ATA Version is:   ATA/ATAPI-7 T13/1532D revision 1
Local Time is:    Tue Apr 28 12:24:37 2015 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x02)    Offline data collection activity
                    was completed without error.
                    Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0)    The previous self-test routine completed
                    without error or no self-test has ever 
                    been run.
Total time to complete Offline 
data collection:         (  360) seconds.
Offline data collection
capabilities:              (0x5b) SMART execute Offline immediate.
                    Auto Offline data collection on/off support.
                    Suspend Offline collection upon new
                    command.
                    Offline surface scan supported.
                    Self-test supported.
                    No Conveyance Self-test supported.
                    Selective Self-test supported.
SMART capabilities:            (0x0003)    Saves SMART data before entering
                    power-saving mode.
                    Supports SMART auto save timer.
Error logging capability:        (0x01)    Error logging supported.
                    General Purpose Logging supported.
Short self-test routine 
recommended polling time:      (   6) minutes.
Extended self-test routine
recommended polling time:      (  36) minutes.

SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  9 Power_On_Hours          0x0032   098   098   000    Old_age   Always       -       9859
 12 Power_Cycle_Count       0x0032   093   093   000    Old_age   Always       -       6929
175 Program_Fail_Count_Chip 0x0032   100   100   011    Old_age   Always       -       0
176 Erase_Fail_Count_Chip   0x0032   100   100   011    Old_age   Always       -       0
177 Wear_Leveling_Count     0x0013   099   099   023    Pre-fail  Always       -       589
178 Used_Rsvd_Blk_Cnt_Chip  0x0013   093   093   011    Pre-fail  Always       -       8
179 Used_Rsvd_Blk_Cnt_Tot   0x0013   098   098   010    Pre-fail  Always       -       51
180 Unused_Rsvd_Blk_Cnt_Tot 0x0013   098   098   010    Pre-fail  Always       -       3853
181 Program_Fail_Cnt_Total  0x0032   100   100   010    Old_age   Always       -       0
182 Erase_Fail_Count_Total  0x0032   100   100   010    Old_age   Always       -       0
183 Runtime_Bad_Block       0x0013   100   100   010    Pre-fail  Always       -       0
187 Reported_Uncorrect      0x0033   099   099   000    Pre-fail  Always       -       11
195 Hardware_ECC_Recovered  0x001a   199   199   000    Old_age   Always       -       11
198 Offline_Uncorrectable   0x0030   100   100   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x003e   253   253   000    Old_age   Always       -       0
233 Media_Wearout_Indicator 0x003a   001   001   000    Old_age   Always       -       2674095
234 Unknown_Attribute       0x0012   100   100   000    Old_age   Always       -       0
235 Unknown_Attribute       0x0012   100   100   000    Old_age   Always       -       0
236 Unknown_Attribute       0x0012   099   099   000    Old_age   Always       -       717
237 Unknown_Attribute       0x0012   099   099   000    Old_age   Always       -       938
238 Unknown_Attribute       0x0012   100   100   000    Old_age   Always       -       0

SMART Error Log Version: 1
ATA Error Count: 11 (device log contains only the most recent five errors)
    CR = Command Register [HEX]
    FR = Features Register [HEX]
    SC = Sector Count Register [HEX]
    SN = Sector Number Register [HEX]
    CL = Cylinder Low Register [HEX]
    CH = Cylinder High Register [HEX]
    DH = Device/Head Register [HEX]
    DC = Device Command Register [HEX]
    ER = Error register [HEX]
    ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 11 occurred at disk power-on lifetime: 5900 hours (245 days + 20 hours)
  When the command that caused the error occurred, the device was sleeping.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 08 40 4a 0e e8  Error: UNC 8 sectors at LBA = 0x080e4a40 = 135154240

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 08 40 4a 0e e8 00      10:10:21.000  READ DMA
  c8 00 20 a3 bf 25 e0 00      10:10:21.000  READ DMA
  c8 00 08 38 4a 0e e8 00      10:10:21.000  READ DMA
  c8 00 80 40 4a 0e e8 00      10:10:21.000  READ DMA
  c8 00 08 30 4a 0e e8 00      10:10:21.000  READ DMA

Error 10 occurred at disk power-on lifetime: 5900 hours (245 days + 20 hours)
  When the command that caused the error occurred, the device was sleeping.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 78 40 4a 0e e8  Error: UNC 120 sectors at LBA = 0x080e4a40 = 135154240

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 80 38 4a 0e e8 00      10:10:21.000  READ DMA
  c8 00 08 28 4a 0e e8 00      10:10:21.000  READ DMA
  c8 00 20 30 ac 20 e0 00      10:10:21.000  READ DMA

Error 9 occurred at disk power-on lifetime: 5900 hours (245 days + 20 hours)
  When the command that caused the error occurred, the device was sleeping.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 70 40 4a 0e e8  Error: UNC 112 sectors at LBA = 0x080e4a40 = 135154240

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 80 30 4a 0e e8 00      10:10:21.000  READ DMA
  c8 00 08 20 4a 0e e8 00      10:10:21.000  READ DMA
  c8 00 00 30 ab 20 e0 00      10:10:21.000  READ DMA
  c8 00 00 30 aa 20 e0 00      10:10:21.000  READ DMA

Error 8 occurred at disk power-on lifetime: 5900 hours (245 days + 20 hours)
  When the command that caused the error occurred, the device was sleeping.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 68 40 4a 0e e8  Error: UNC 104 sectors at LBA = 0x080e4a40 = 135154240

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 80 28 4a 0e e8 00      10:10:21.000  READ DMA
  c8 00 08 18 4a 0e e8 00      10:10:21.000  READ DMA
  c8 00 00 30 a9 20 e0 00      10:10:21.000  READ DMA
  c8 00 00 30 a8 20 e0 00      10:10:21.000  READ DMA
  c8 00 00 30 a7 20 e0 00      10:10:21.000  READ DMA

Error 7 occurred at disk power-on lifetime: 5900 hours (245 days + 20 hours)
  When the command that caused the error occurred, the device was sleeping.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 60 40 4a 0e e8  Error: UNC 96 sectors at LBA = 0x080e4a40 = 135154240

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 80 20 4a 0e e8 00      10:10:20.000  READ DMA
  c8 00 08 10 4a 0e e8 00      10:10:20.000  READ DMA
  c8 00 00 30 a5 20 e0 00      10:10:20.000  READ DMA

SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Extended offline    Completed without error       00%      9859         -
# 2  Extended offline    Completed without error       00%      9853         -
# 3  Short offline       Completed without error       00%      9853         -
# 4  Short offline       Completed without error       00%      4941         -
# 5  Short offline       Completed without error       00%      4806         -

SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

- - - Beitrag zusammengeführt - - -

So hab jetzt selbst versucht mir das verständlicher zu machen.
233 Media_Wearout_Indicator 0x003a 001 001 000 Old_age Always - 2674095

Bedeutet ja eigentlich, dass die SSD am Ende angekommen ist, da der Optimale Wert 100 beträgt. Die Laufzeit ist ja auch eher hoch.

Doch die Fehlermeldungen am Schluss erschließen sich mir immer noch nicht.

Hat das "Passed" dann überhaupt eine Bedeutung? Oder zeigt das nur an, das während der Überprüfung keine Fehler aufgetreten sind. Was aber im Endeffekt keinen
Aufschluss über den Zustand gibt?
 
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